Materials Innovation...
The Core to Cree GaN Epitaxy Technology
Cree
Materials Develops High Quality Epitaxial Device Materials
Cree
Materials continues to be a world leader in commercialization
of innovative materials research. Our core competencies
in materials growth for RF power electronics and specialty
opto electronics have proven to be a valuable asset
to our customers for high performance devices.
Cree
Materials Uses Robust And Relevant Materials Characterization
Techniques
Cree
Materials prides itself in the use of sophisticated analytical
and characterization tools to ensure that our customers’
expectations are always exceeded. Cree Materials will
supply the customer with data that indicates the
quality of the epitaxial layer and substrate. A
certificate that insures the epitaxial layer and
substrate comply with Cree Materials specifications is
included with product shipments.
In House Characterization Techniques Include:
Atomic force microscopy (AFM)
Field emission scanning electron microscopy
Electrodispersive spectroscopy
Ultra violet/visible transmission
Contactless resistivity mapping
Variable temperature photo luminescense
Variable temperature Hall effect
Mercury probe capacitance-voltage (CV)
High resolution x-ray (HRXRD)
Reciprocal space mapping
Omega 2 theta
Reflectometry
Cree
Materials Uses Advanced Process Control
Cree
Materials' team of expert engineers and scientists
work hard to bring the latest statistical process
control advancements rapidly to our product offerings.
Customers benefit from this value added approach with
repeatable device performance.
